Stacking layers of two-dimensional materials on top of each other and varying the twist angle between them massively alters their electronic properties. The trick is to get the twist angle just right, and to know when you’ve done so. Researchers in China have now developed a technique that helps with the second part of this challenge. By allowing scientists to directly visualize the variations in local twist angles, the new technique shed light on the electronic structure of twisted materials and accelerate the development of devices that exploit their properties.
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